USCB TOB module testing results for M800 productions

UCSB TOB M 800 Module Test Result Page

Summary of module test on ARC stand

Channel Fault definitions

First pass at channel fault definitions.  To be marked as having a
 given fault, the channel must fail ALL tests.  Otherwise, it is marked at 
failing a test and needing some extra study.  The averages is over CHIPS.

PEAK MODE
Failure Type Noise (ADC) Gain slope/< Gain slope > Pinhole/< Pinhole > Pulse shape risetime Comments
Hybrid-PA open 0.75 < N < 1.1 1.12 < G(norm) < 1.18     Cannot distinguish from PA-sensor open
PA-Sensor open 0.75 < N < 1.1 1.12 < G(norm) < 1.18      
Sensor-Sensor open 1.1 < N < 1.4 G(norm) > 1.18      
Shorted Strips ???? ???? ???? ???? Had not studied enough yet
Noisy Strips N > 2   1.8 < PH(norm) < 4.5;    
Pinhole(saturated) N < 0.75 G(norm) < 0.3 P(norm) > 4.5     

DECONVOLUTION MODE
Failure Type Noise (ADC) Gain slope/< Gain slope > Pinhole/< Pinhole > Pulse shape risetime Comments
Hybrid-PA open 1.1 < N < 1.45 1.12 < G(norm) < 1.40     Cannot distinguish from PA-sensor open
PA-Sensor open 1.1 < N < 1.45 1.12 < G(norm) < 1.4      
Sensor-Sensor open 1.45 < N < 1.75 G(norm) > 1.40      
Shorted Strips ???? ???? ???? ???? Had not studied enough yet
Noisy Strips N > 2.4   1.8 < PH(norm) < 4.5;    
Pinhole(saturated) N < 1.1 G(norm) < 0.3 P(norm) > 4.5      




TOB Preproduction Modules (30200020000XXX)
Module
Bias VoltagesUsed
Depletion Voltage
Faults found in testing
Total Faults Found
Comments
Near Sensor
Far Sensor
Opens
Shorted Strips
Pinholes(Saturated)
Noisy Strips
Hybrid-PA
PA-Sensor
Sensor-Sensor
865(pre)
0, 250 V
250 V
250 V
 
 
 
 
49,385
48,50
4 (0.8%)
Bad CAC 7,8 506,507
865(final)
0, 250 V
250 V
250 V
 
8,270,271,385,390
49,245,371,507,512
 
 
48,50,244,246,269, 271,370,372
15.5 (3.0%)
Bias Return Wire Bond Initially Missig, Damaged Sensor
866(pre)
0, 250 V
250 V
250 V
 
 
 
 
82,372
81,83,239
5 (1.0%)
 
866(final)
0, 250 V
250 V
250 V
 
53,54,55,82,136,137,138, 228,229,230,231,232
372
 
 
52,55,81,83,139, 227,233,239
20.5 (4.0%)
Bias Return Wire Bond Initially Missig, Damaged Sensor
867(pre)
0, 250 V
250 V
250 V
 
254,372
 
 
17,154
388,389
6 (1.2%)
Bad CAC 316,317 467,468,469,470
867(final)
0, 250 V
250 V
250 V
 
154,254,372,468,469,470
7,17,141,317
 
 
7,9
10 (2.0%)
Bias Return Wire Bond Initially Missig, Damaged Sensor
876(pre)
0, 250 V
250 V
250 V
 
1,2,511
266,295
 
500
278,279
7 (1.4%)
Bad CAC 92,93
876(final)
0V, 250 V, 550V
250 V
250 V
 
1,2,93,511
266,295,500
 
 
278,279
7 (1.4%)
 
877(final)
0V, 250 V, 550V
250 V
250 V
 
 
 
 
 
0 (334*)
0 (0.0%)
 
878(final)
0V, 250 V, 550V
250 V
250 V
 
 
 
 
 
0 (376*,377*)
0 (0.0%)
 
879(final)
0V, 250 V, 550V
250 V
250 V
 
 
 
 
 
 
0 (0.0%)
 
880(pre)
0V, 250 V
250 V
250 V
 
 
 
 
91,255
 
2 (0.4%)
Bad CAC 422, 423
880(final)
0V, 250 V, 550V
250 V
250 V
 
91
255,423
 
 
0 (90*,92*)
2(0.4%)
 
 

 * denotes channels that have increasing noise with increasing bias
 voltage; the channel is below the noise threshold at depletion, but is marked
 as noisy at 550 V.  Channels either have sensor defect or are neighbors to
 pulled pinhole/high current strip.  Sensor-sensor opens count as a half of a 
bad channel.

Testing Setup optizimed to minimize difference between the raw and common-mode
 subtracted noise with the invertor off in peak mode.   When the two match, 
the common mode subtraction feature on the chip is doing nothing, yielding
 predictable results for noise measurements.

Module
Root files
Summary Files and Plots
O V Bias
250 V Bias
550 V Bias
250 V Bias
550 V Bias
865(pre)
file
file
 
tar file
 
865(final)
 
file
 
tar file
 
866(pre)
file
file
 
tar file
 
866(final)
 
file
 
tar file
 
867(pre)
file
file
 
tar file
 
867(final)
 
file
 
tar file
 
876(pre)
file
file
file
tar file
tar file
876(final)
file
file
file
tar file
tar file
877(final)
file
file
file
tar file
tar file
878(final)
file
file
file
tar file
tar file
879(final)
file
file
file
tar file
tar file
880(pre)
file
file
 
tar file
 
880(final)
file
file
file
tar file
tar file